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Journal of Applied Physics

Volumn 77, Issue 7, 1995, Pages 3121-3125

Recrystallization of a planar amorphous-crystalline interface in silicon by low energy recoils: A molecular dynamics study

(3) Caturla, Maria Jose a Diaz De La Rubia, Tomas a Gilmer, George H b

a LAWRENCE LIVERMORE NATIONAL LABORATORY (United States)

b LUCENT TECHNOLOGIES (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36449005772 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.358664 Document Type: Article

Times cited : (54)

References (12)

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8
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- Beeler, J.R.¹

9
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- (unpublished)
- Diaz de la Rubia, T.¹ Gilmer, G.H.²

10
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- (1991) Phys. Rev. B , vol.44 , pp. 3702
- Roorda, S.¹ Sinke, W.C.² Poate, J.M.³ Jacobson, D.C.⁴ Dierker, S.⁵ Dennis, B.S.⁶ Eaglesham, D.J.⁷ Spaepen, F.⁸ Fuoss, P.⁹

11
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12
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- (to be published 1995)
- Nucl. Instrum. Methods B
- Stock, D.M.¹ Gilmer, G.H.² Jaraiz, M.³ de la Rubia, T.D.⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.