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Volumn 65, Issue 3, 1994, Pages 324-326

Diffusion of ion implanted Sn in Si, Si1-xGex, and Ge

Author keywords

[No Author keywords available]

Indexed keywords


EID: 36449004823     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.112360     Document Type: Article
Times cited : (34)

References (15)
  • 9
    • 0003412161 scopus 로고
    • The Stopping and Range of Ions in Solids
    • (Pergamon, New York) TRIM 90, J. F. Ziegler, J. P. Biersack, and U. Littmark.
    • (1985)
  • 15
    • 84951891383 scopus 로고    scopus 로고
    • A linear dependence between activation energy and Ge content results in an exponential dependence for the diffusion coefficient if the pre-exponential factor, [formula omitted] is independent of the Ge content


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.