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Journal of Applied Physics

Volumn 75, Issue 10, 1994, Pages 6659-6664

Orientational dependence of the exchange biasing in molecular-beam-epitaxy- grown ni80fe20/fe50mn50 bilayers (invited)

(5) Jungblut, R a Coehoorn, R a Johnson, M T a Aan De Stegge, J a Reinders, A a

a PHILIPS RESEARCH LABORATORIES (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36449004598 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.356888 Document Type: Article

Times cited : (336)

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