Electron energy states at the interface between semi-insulating polycrystalline silicon and crystalline silicon

Journal of Applied Physics

Volumn 78, Issue 3, 1995, Pages 1824-1831

  Liss, Bo ^a   Engström, Olof ^a  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

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[No Author keywords available]

Indexed keywords

EID: 36449004535     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.360215     Document Type: Article

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