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Volumn 69, Issue 4, 1991, Pages 2512-2521

Positive charge generation in metal-oxide-semiconductor capacitors

Author keywords

[No Author keywords available]

Indexed keywords


EID: 36449004449     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.348689     Document Type: Article
Times cited : (103)

References (33)
  • 2
    • 84951139924 scopus 로고
    • An Electrical Characterization of Low Temperature, High Pressure Thermal Silicon Dioxide
    • Lehigh University Doctoral Thesis, unpublished
    • (1984)
    • Trombetta, L.P.1
  • 5
    • 84951181392 scopus 로고
    • A Model for Interface State Generation During Charge Injection in [formula omitted] Capacitors
    • Ph. D. dissertation, Lehigh University, Bethlehem, PA, unpublished
    • (1985)
    • Chew, H.1
  • 10
    • 84951185474 scopus 로고
    • Proceedings of the Thirty-Second Frequency Control Symposium, Atlantic City, NJ
    • (1979)
    • Griscom, D.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.