Native point defects in low-temperature-grown GaAs

Applied Physics Letters

Volumn 67, Issue , 1995, Pages 279-

  Liu, X ^a   Prasad, A ^a   Nishio, J ^a,c   Weber, E R ^a   Liliental Weber, Z ^b   Walukiewicz, W ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c TOSHIBA CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36449004353     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.114782     Document Type: Article

References (0)