Effect of microstructural features on media noise in longitudinal recording media

Journal of Applied Physics

Volumn 73, Issue 10, 1993, Pages 5566-5568

  Nolan, T P ^a   Sinclair, R ^a   Ranjan, R ^b   Yamashita, T ^b  

^a STANFORD UNIVERSITY   (United States)

^b WESTERN DIGITAL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36449003254     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.353652     Document Type: Review

References (0)