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Journal of Applied Physics

Volumn 71, Issue 4, 1992, Pages 1729-1731

Numerical investigations of the electromigration boundary value problem

(2) Clement, J J a Lloyd, J R a

a HEWLETT PACKARD COMPANY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36449003103 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.351204 Document Type: Article

Times cited : (56)

References (11)

1
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- Nikawa, K.¹

3
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5
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- Kircheim, R.¹ Kaeber, U.²

7
- 0001467312
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- De Groot, S.R.¹

8
- 84953834745
- (in preparation)
- Lloyd, J.¹ Kitchin, J.F.²

9
- 0021508154
- (1985) IEEE Trans. Computer Aided Design , vol.CAD-4 , pp. 384
- Pichler, P.¹ Jungling, W.² Selberherr, S.³ Guerrero, E.⁴ Pötzl, H.⁵

10
- 0001457939
- (1991) J. Appl. Phys. , vol.69 , pp. 2117
- Lloyd, J.R.¹ Kitchin, J.F.²

11
- 0020115364
- and references therein
- (1983) J. Vac. Sci. Technol. A , vol.1 , pp. 455
- Lloyd, J.R.¹ Smith, P.M.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.