Interface roughness characterization using x-ray standing waves

Journal of Applied Physics

Volumn 75, Issue 8, 1994, Pages 3806-3809

  Kawamura, Tomoaki ^a   Takenaka, Hisataka ^a  

^a NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36449002442     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.356056     Document Type: Article

References (0)