A detailed analysis of the optical beam deflection technique for use in atomic force microscopy

Journal of Applied Physics

Volumn 72, Issue 1, 1992, Pages 6-12

  Putman, Constant A J ^a   De Grooth, Bart G ^a   Van Hulst, Niek F ^a   Greve, Jan ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36449002421     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.352149     Document Type: Article

References (22)