Effects of hydrogen on structural relaxation and defect evolution in amorphous silicon

Applied Physics Letters

Volumn , Issue , 1995, Pages 3126-

  Hiroyama, Y ^a   Motooka, T ^a   Suzuki, R ^b   Hirano, Y ^c   Sato, F ^c  

^a KYUSHU UNIVERSITY   (Japan)

^b ELECTROTECHNICAL LABORATORY   (Japan)

^c NHK SCIENCE AND TECHNICAL RESEARCH LABORATORIES   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36449002098     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.115799     Document Type: Article

References (0)