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Applied Physics Letters

Volumn , Issue , 1995, Pages 1662-

Preparation and characterization of ultrathin porous silicon films

(3) Von Behren, J a,b Tsybeskov, L a Fauchet, P M a,c

a UNIVERSITY OF ROCHESTER (United States)

b TECHNICAL UNIVERSITY OF MUNICH (Germany)

c Laboratory for Laser Energetics ^*

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36449001785 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.113885 Document Type: Article

Times cited : (47)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.