SCOPUS 정보 검색 플랫폼

Volumn 59, Issue 25, 1991, Pages 3241-3243

Correlation of texture with electromigration behavior in Al metallization

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36449001407 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.105745 Document Type: Article

Times cited : (116)

References (19)

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- Attardo, M.J.¹ Rosenberg, R.²

11
- 0040985662
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- Vaidya, S.¹ Sinha, A.K.²

12
- 11944275568
- (1990) Ann. Rev. Mater. Sci. , vol.20 , pp. 245
- Thompson, C.V.¹

13
- 84951221263
- April; to be published, MRS Proceedings Series, presented at MRS Spring Meeting
- (1991) , vol.225
- Knorr, D.B.¹ Rodbell, K.P.² Tracy, D.P.³

15
- 36549101239
- (1989) Appl. Phys. Lett. , vol.54 , pp. 2210
- Knorr, D.B.¹ Lu, T.-M.²

16
- 84951221264
- to be published in Proceedings, 9th International Conference on Textures of MaterialsAvignon, France
- (1990)
- Knorr, D.B.¹ Tracy, D.P.² Lu, T.-M.³

17
- 3643062740
- presented at MRS Fall Meeting, November 1990, Boston, MA; Evolution of Thin Film and Surface Microstructures (MRS, Pittsburgh, PA)
- (1991) , pp. 199
- Knorr, D.B.¹ Tracy, D.P.² Lu, T.-M.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.