Microstructure and composition of composite SiO2/TiO2 thin films

Journal of Applied Physics

Volumn 69, Issue 5, 1991, Pages 3037-3045

  Gluck, N S ^a   Sankur, H ^a   Heuer, J ^a   DeNatale, J ^a   Gunning, W J ^a  

^a ROCKWELL SCIENCE CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36449001268     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.348591     Document Type: Article

References (21)