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Volumn 64, Issue 3, 1994, Pages 345-347
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Simultaneous shallow-junction formation and gate doping p-channel metal-semiconductor-oxide field-effect transistor process using cobalt silicide as a diffusion/doping source
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 36449001189
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.111143 Document Type: Article |
Times cited : (7)
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References (8)
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