Magnetic and structural characterization of sputtered FeN multilayer films

Journal of Applied Physics

Volumn 70, Issue 10, 1991, Pages 6427-6429

  Russak, Michael A ^a   Jahnes, Christopher V ^a   Klokholm, Erik ^a   Lee, Jo Won ^a   Re, Mark E ^a   Webb, Bucknell C ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36449000671     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.349918     Document Type: Article

References (17)