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Applied Physics Letters

Volumn 67, Issue , 1995, Pages 377-

Direct experimental evidence for trap-state mediated excitation of Er 3+ in silicon

(3) Shin, Jung H a Van Den Hoven, G N a Polman, A a

a FOM INSTITUTE AMOLF (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36449000447 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.114634 Document Type: Article

Times cited : (46)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.