High-resolution imaging using near-field scanning optical microscopy and shear force feedback in water

Applied Physics Letters

Volumn , Issue , 1995, Pages 3380-

  Moyer, Patrick J ^a   Kämmer, Stefan B ^a  

^a TopoMetrix Corporation   (United States)

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EID: 36449000411     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116510     Document Type: Article

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