Unconnected junction contrast in ion beam induced charge microscopy

Applied Physics Letters

Volumn , Issue , 1995, Pages 532-

  Kolachina, S ^a   Ong, V K S ^a   Chan, D S H ^a   Phang, J C H ^a   Osipowicz, T ^a   Watt, F ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

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EID: 36448999997     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116390     Document Type: Article

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