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Volumn 65, Issue 14, 1994, Pages 1775-1777

Nanolithography with an atomic force microscope for integrated fabrication of quantum electronic devices

Author keywords

[No Author keywords available]

Indexed keywords


EID: 36448999924     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.112914     Document Type: Article
Times cited : (108)

References (23)
  • 20
    • 84951351954 scopus 로고    scopus 로고
    • AFM silicon tips from Nanoprobe. The tip radius is about 10 nm, the tip angle is 30°


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.