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Volumn , Issue , 1995, Pages 448-
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Three-stage lattice relaxation of Ge islands on Si(111) measured by tunneling microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 36448999756
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.114052 Document Type: Article |
Times cited : (34)
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References (21)
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