Characterization of a tunable thin film microwave YBa2Cu 3O7-x/SrTiO3 coplanar capacitor

Applied Physics Letters

Volumn 63, Issue 22, 1993, Pages 3078-3080

  Galt, David ^a   Price, John C ^a   Beall, James A ^b   Ono, Ronald H ^b  

^a UNIVERSITY OF COLORADO   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36448999438     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.110238     Document Type: Article

References (10)