Computing shape parameter sensitivity of the field of one-dimensional surface-relief gratings by using an analytical approach based on RCWA

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 24, Issue 9, 2007, Pages 2692-2700

  van der Aa, N P ^a   Mattheij, R M M ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; DIFFERENTIATION (CALCULUS); EIGENVALUES AND EIGENFUNCTIONS; FINITE DIFFERENCE METHOD; ONE DIMENSIONAL; OPTICAL VARIABLES MEASUREMENT;

RIGOROUS COUPLED-WAVE ANALYSIS (RCWA); SHAPE PARAMETER SENSITIVITY; SURFACE-RELIEF GRATINGS;

DIFFRACTION GRATINGS;

EID: 36448995484     PISSN: 10847529     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAA.24.002692     Document Type: Article

References (9)

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