Electrical impedance tomography through constrained sequential linear programming: A topology optimization approach

Measurement Science and Technology

Volumn 18, Issue 9, 2007, Pages 2847-2858

  De Lima, Cícero R ^a   Mello, Luis A M ^a   Lima, Raul Gonzalez ^a   Silva, Emílio C N ^a  

^a UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

Constraints; Electrical impedance tomography; Finite element method; Inverse problem; Regularization; Topology optimization

Indexed keywords

CONSTRAINT THEORY; FINITE ELEMENT METHOD; INVERSE PROBLEMS; LINEAR PROGRAMMING; SHAPE OPTIMIZATION;

CONDUCTIVITY DISTRIBUTION; FINITE ELEMENT (FE) MODEL;

ELECTRIC IMPEDANCE TOMOGRAPHY;

CONSTRAINT THEORY; ELECTRIC IMPEDANCE TOMOGRAPHY; FINITE ELEMENT METHOD; INVERSE PROBLEMS; LINEAR PROGRAMMING; SHAPE OPTIMIZATION;

EID: 36448958010     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/18/9/014     Document Type: Article

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