Dependency of deformation twinning on grain orientation in an FCC and a HCP metal

Frontiers of Materials Science in China

Volumn 1, Issue 4, 2007, Pages 331-341

  Yang, Ping ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY BEIJING   (China)

Author keywords

EBSD (electron backscatter diffraction); Microstructure; Orientation; Twinning

Indexed keywords

EID: 36448955728     PISSN: 16737377     EISSN: 16737482     Source Type: Journal    
DOI: 10.1007/s11706-007-0062-5     Document Type: Article

References (16)

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