Thermally activated phase slippage in high-Tc grain-boundary Josephson junctions

Physical Review Letters

Volumn 64, Issue 2, 1990, Pages 228-231

  Gross, R ^a   Chaudhari, P ^a   Dimos, D ^a   Gupta, A ^a   Koren, G ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

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Indexed keywords

EID: 3643062080     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.64.228     Document Type: Article

References (12)