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Volumn 749, Issue , 2005, Pages 85-87

Novel technique for trace element analysis using the ECRIS and heavy ion linear accelerator (ECRIS-AMS)

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EID: 36349022354     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.1893372     Document Type: Conference Paper
Times cited : (2)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.