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Volumn , Issue , 2007, Pages 1679-1683

The practical feasibility of using RFID in a metal environment

Author keywords

[No Author keywords available]

Indexed keywords

PARAMETER ESTIMATION; SIGNAL INTERFERENCE; TRANSPONDERS; UHF DEVICES;

EID: 36349021246     PISSN: 15253511     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/WCNC.2007.316     Document Type: Conference Paper
Times cited : (21)

References (10)
  • 1
    • 0026096861 scopus 로고    scopus 로고
    • Radiofrequency field measurements and hazard assessment
    • Allen S G, "Radiofrequency field measurements and hazard assessment", Journal of Radiological Protection, Vol 11-1, 1996.
    • (1996) Journal of Radiological Protection , vol.11 -1
    • Allen, S.G.1
  • 3
    • 36348933807 scopus 로고    scopus 로고
    • RFID Handbook, Radio Frequency Fundamentals and Applications by Klaus Finkenzeller, John Wiley & sons Ltd., Reprinted June 2000
    • RFID Handbook, Radio Frequency Fundamentals and Applications by Klaus Finkenzeller, John Wiley & sons Ltd., Reprinted June 2000
  • 4
    • 36348950712 scopus 로고    scopus 로고
    • Performance Benchmarks for Passive UHF RFID by Masters thesis,Anna University, India, October
    • Performance Benchmarks for Passive UHF RFID by Karthik Ramakrishnan, Masters thesis,Anna University, India, October,2005.
    • (2005)
    • Ramakrishnan, K.1
  • 5
    • 36348960553 scopus 로고    scopus 로고
    • Hugo Mallinson, Steve Hodges, Alan Thorne Determining a Better Metric for RFID Performance in Environments with Varying Noise Levels, accepted to the 2006 IEEE MMAR, Miedzyzdroje, Poland,August 2006.
    • Hugo Mallinson, Steve Hodges, Alan Thorne "Determining a Better Metric for RFID Performance in Environments with Varying Noise Levels," accepted to the 2006 IEEE MMAR, Miedzyzdroje, Poland,August 2006.
  • 8
    • 36348935997 scopus 로고    scopus 로고
    • Engineering Statistics, a book on statistics By Montgomery, Runger and Hubele, John Wiley & Sons LTD, third edition
    • Engineering Statistics, a book on statistics By Montgomery , Runger and Hubele, John Wiley & Sons LTD, third edition.
  • 10
    • 28744446316 scopus 로고    scopus 로고
    • Kulkami A.K., Parlikad, A.K.N., McFarlane, D.C., Networked RFID Systems in Product Recovery Management, accepted to the 2005 IEEE International Symposium on Electronics and the Environment & the IAER Electronics Recycling Summit, New Orleans, USA, May 2005.
    • Kulkami A.K., Parlikad, A.K.N., McFarlane, D.C., "Networked RFID Systems in Product Recovery Management," accepted to the 2005 IEEE International Symposium on Electronics and the Environment & the IAER Electronics Recycling Summit, New Orleans, USA, May 2005.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.