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Volumn , Issue , 2003, Pages 36-39

Computer aided reliability assessment

Author keywords

Circuits; Failure analysis; Geometry; Materials testing; Military standards; Packaging; Qualifications; Robustness; Software libraries; Stress

Indexed keywords

COMPUTER SOFTWARE; ELECTRONICS PACKAGING; FAILURE ANALYSIS; GEOMETRY; MATERIALS TESTING; NETWORKS (CIRCUITS); PACKAGING; PACKAGING MATERIALS; PRODUCT DESIGN; ROBUSTNESS (CONTROL SYSTEMS); SOFTWARE TESTING; STANDARDS; STRESSES;

EID: 36349007886     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EPTC.2003.1298689     Document Type: Conference Paper
Times cited : (1)

References (6)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.