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Volumn , Issue , 2003, Pages 36-39
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Computer aided reliability assessment
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Author keywords
Circuits; Failure analysis; Geometry; Materials testing; Military standards; Packaging; Qualifications; Robustness; Software libraries; Stress
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Indexed keywords
COMPUTER SOFTWARE;
ELECTRONICS PACKAGING;
FAILURE ANALYSIS;
GEOMETRY;
MATERIALS TESTING;
NETWORKS (CIRCUITS);
PACKAGING;
PACKAGING MATERIALS;
PRODUCT DESIGN;
ROBUSTNESS (CONTROL SYSTEMS);
SOFTWARE TESTING;
STANDARDS;
STRESSES;
CIRCUIT CARD;
COMPUTER AIDED RELIABILITIES;
DESIGN FOR RELIABILITY;
ELECTRONIC PRODUCT;
ELECTRONIC SYSTEMS;
INTEGRATED SOFTWARE;
QUALIFICATIONS;
SOFTWARE LIBRARIES;
SOFTWARE RELIABILITY;
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EID: 36349007886
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/EPTC.2003.1298689 Document Type: Conference Paper |
Times cited : (1)
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References (6)
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