The SURE-LET approach to image denoising

IEEE Transactions on Image Processing

Volumn 16, Issue 11, 2007, Pages 2778-2786

  Blu, Thierry ^a   Luisier, Floiran ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; DISCRETE WAVELET TRANSFORMS; MATHEMATICAL MODELS; MEAN SQUARE ERROR; OPTIMIZATION; STATISTICAL METHODS;

IMAGE DENOISING; STATISTICAL MODEL; STEIN'S UNBIASED RISK ESTIMATE (SURE);

IMAGE PROCESSING;

ALGORITHM; ARTICLE; ARTIFACT; COMPUTER ASSISTED DIAGNOSIS; COMPUTER SIMULATION; IMAGE ENHANCEMENT; METHODOLOGY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; STATISTICAL ANALYSIS; STATISTICAL MODEL;

ALGORITHMS; ARTIFACTS; COMPUTER SIMULATION; DATA INTERPRETATION, STATISTICAL; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; MODELS, STATISTICAL; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY;

EID: 36348943666     PISSN: 10577149     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIP.2007.906002     Document Type: Article

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