Rare earth dibenzoylmethane complexes for potential application as high-density recordable optical recording materials

Materials Letters

Volumn 62, Issue 2, 2008, Pages 286-288

  Jiang, Xin ^a,b   Wu, Yiqun ^a,c   He, Chunying ^a  

^a HEILONGJIANG UNIVERSITY   (China)

^b JIAMUSI UNIVERSITY   (China)

^c SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

Author keywords

Absorption spectra; Optical storage; Rare earth dibenzoylmethane complexes; Thermal properties; Thin films

Indexed keywords

ABSORPTION SPECTRA; CHEMICAL ANALYSIS; SPIN COATING; SYNTHESIS (CHEMICAL); THIN FILMS;

GLASS SUBSTRATES; OPTICAL STORAGE; RARE EARTH DIBENZOYLMETHANE COMPLEXES; SMOOTH FILMS;

LIGANDS;

EID: 36249007983     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2007.05.016     Document Type: Article

References (16)

1. Nishiwaki H., Kitano K., Nakajima H., Japan, et al. J. Appl. Phys. 45 (2006) 1452-1455
2. Gan F., and Hou L. Proc. SPIE Int. Soc. Opt. Eng. 5060 (2002) 1-6
3. Dohoon C., Duseop Y., Myongdo R., et al. Jpn. J. Appl. Phys. 42 (2003) 754-758
4. Huang F.X., Wu Y.Q., Gu D.H., et al. J. Dyes Pigm. 66 (2005) 77-82
5. Migalska-Zalas A., Sofiani Z., Sahraoui B., et al. J. Phys. Chem. B 108 (2004) 14942-14947
6. T. Miyazawa, S. Madda, A. Ichionsawa et al., JP., 2002-036727, 2002.
7. Ma D., Wu Y., and Zuo X. J. Mater. Lett. 59 (2005) 3678-3681
8. Meinders E.R., and Tieke B. Jpn. J. Appl. Phys. 42 (2003) 834-840
9. Melby L.R., Rose N.J., Abramson E., et al. J. Am. Chem. Soc. 86 (1964) 5117-5125
10. Dryden R.P., and Winston A. J. Phys. Chem. 62 (1958) 635-637
11. Charette J., Neirynck G., and Teyssie P. J. Phys. Chem. 65 (1961) 735-739
12. Gastone G., Valerio B., Valeria F., et al. J. Acta. Cryst. B49 (1993) 564-576
13. Wang S., and Shen S. Mater. Sci. Eng., B, Solid-State Mater. Adv. Technol. 79 (2001) 45-48
14. Sultan R., Gadamsetti K., and Swavey S. Inorg. Chim. Acta. 359 (2006) 1233-1238
15. Huang F.X., Wu Y.Q., Gu D.H., and Gan F.X. Thin Solid Films 483 (2005) 251-256
16. Takanobu H., and Hajime K. J. Appl. Phys. 39 (2000) 933-936