Adaptive speckle imaging interferometry: A new technique for the analysis of microstructure dynamics, drying processes and coating formation

Optics Express

Volumn 15, Issue 23, 2007, Pages 15250-15259

  Brunel, L ^a   Brun, A ^a   Snabre, P ^b   Cipelletti, L ^c  

^a FORMULACTION ^*  (France)

^b CNRS   (France)

^c INSTITUT UNIVERSITAIRE DE FRANCE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; IMAGING TECHNIQUES; MICROSTRUCTURE; SPECKLE; SPECTROSCOPY;

COATING FORMATION; DRYING PROCESSES; MULTI-SPECKLE DIFFUSING WAVE SPECTROSCOPY; NON-STATIONARY MICROSCOPIC DYNAMICS;

INTERFEROMETRY;

EID: 36248981008     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.15.015250     Document Type: Article

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