Time-of-flight based pixel architecture with integrated double-cathode photodetector

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6616, Issue PART 1, 2007, Pages

  Oberhauser, Klaus ^a   Zach, Gerald ^a   Nemecek, Alexander ^a   Zimmermann, Horst ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

OEIC; Optical distance measurement; Opto electronic correlation; PIN photodetector; Time of flight

Indexed keywords

INFORMATION ANALYSIS; INTEGRATED CIRCUITS; LIGHT SOURCES; PHOTODETECTORS; PHOTONS; THREE DIMENSIONAL;

CAMERA CHIPS; OPTICAL DISTANCE MEASUREMENT; OPTO-ELECTRONIC CORRELATION; PIXEL ARCHITECTURE;

PIXELS;

EID: 36248962730     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.725655     Document Type: Conference Paper

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