High speed in situ depth profiling of ultrafast micromachining

Optics Express

Volumn 15, Issue 23, 2007, Pages 14967-14972

  Webster, Paul J L ^a   Muller, Matthew S ^a   Fraser, James M ^a  

^a QUEEN S UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ABLATION; BANDWIDTH; FOURIER ANALYSIS; IMAGING TECHNIQUES; INTERFEROMETRY; LIGHT; STAINLESS STEEL; SYNCHRONIZATION;

ABLATION SURFACE; FOURIER-DOMAIN INTERFEROMETRIC IMAGING; REAL-TIME DEPTH PROFILING;

MICROMACHINING;

EID: 36248943648     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.15.014967     Document Type: Article

References (8)

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