Charge storage characteristics of Au nanocrystals embedded in high- k gate dielectrics on Si

Applied Physics Letters

Volumn 91, Issue 20, 2007, Pages

  Wang, Chen Chan ^a   Wu, Jyun Yi ^a   Chiou, Yan Kai ^a   Chang, Che Hao ^a   Wu, Tai Bor ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CAPACITORS; GATE DIELECTRICS; GOLD; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SEMICONDUCTING SILICON; VOLTAGE CONTROL;

CHARGE RETENTION; DIELECTRIC MATRIX; ELECTRON STORAGE; MEMORY EFFECTS; SEMICONDUCTOR CAPACITORS;

NANOCRYSTALS;

EID: 36248931433     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2804567     Document Type: Article

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