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Volumn 1, Issue 20, 1989, Pages 3289-3293
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Electron-electron scattering in narrow Si accumulation layers
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 36149028879
PISSN: 09538984
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-8984/1/20/010 Document Type: Article |
Times cited : (39)
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References (19)
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