Occurrence and severity of angular leaf spot of common bean in Kenya as influenced by geographical location, altitude and agroecological zones

Plant Pathology Journal

Volumn 6, Issue 3, 2007, Pages 235-241

  Mwang'ombe, A W ^a   Wagara, I N ^b   Kimenju, J W ^a   Buruchara, R A ^c  

^a UNIVERSITY OF NAIROBI   (Kenya)

^b EGERTON UNIVERSITY   (Kenya)

^c Kawanda Agricultural Research Institute   (Uganda)

Author keywords

Bean field; Disease; District; Incidence; Phaeoisariopsis griseola; Prevalence

Indexed keywords

PHAEOISARIOPSIS GRISEOLA;

EID: 36148999519     PISSN: 18125387     EISSN: 18125425     Source Type: Journal    
DOI: 10.3923/ppj.2007.235.241     Document Type: Article

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