-
2
-
-
0036289402
-
Fault-tolerant design of the IBM pSeries 690 system using the POWER4 processor technology
-
D. C. Bossen, A. Kitamorn, K. F. Reick, and M. S. Floyd. Fault-tolerant design of the IBM pSeries 690 system using the POWER4 processor technology. IBM Journal of Research and Development, 46(1), 2002.
-
(2002)
IBM Journal of Research and Development
, vol.46
, Issue.1
-
-
Bossen, D.C.1
Kitamorn, A.2
Reick, K.F.3
Floyd, M.S.4
-
4
-
-
36048956359
-
-
D. Burger, T. M.. Austin, and S. Bennett. Evaluating future microprocessors: The simplescalar tool set. Technical Report CS-TR-1996-1308, University of Wisconsin, 1996.
-
D. Burger, T. M.. Austin, and S. Bennett. Evaluating future microprocessors: The simplescalar tool set. Technical Report CS-TR-1996-1308, University of Wisconsin, 1996.
-
-
-
-
5
-
-
33748849061
-
Bulletproof: A defect-tolerant cmp switch architecture
-
February
-
K. Constanitinides, S. Plaza, J. Blome, B. Zhang, V. Bertacco, S. Mahlke, T. Austin, and M. Orshansky. Bulletproof: A defect-tolerant cmp switch architecture. In Proceedings of the 12th International Symposium on High-Performance Computer Architecture (HPCA-12), February 2006.
-
(2006)
Proceedings of the 12th International Symposium on High-Performance Computer Architecture (HPCA-12)
-
-
Constanitinides, K.1
Plaza, S.2
Blome, J.3
Zhang, B.4
Bertacco, V.5
Mahlke, S.6
Austin, T.7
Orshansky, M.8
-
6
-
-
0038346239
-
Transient-fault recovery for chip multiprocessors
-
ACM Press
-
M. Gomaa, C. Scarbrough, T. N. Vijaykumar, and I. Pomeranz. Transient-fault recovery for chip multiprocessors. In ISCA '03: Proceedings of the 30th annual international symposium on Computer architecture, pages 98-109. ACM Press, 2003.
-
(2003)
ISCA '03: Proceedings of the 30th annual international symposium on Computer architecture
, pp. 98-109
-
-
Gomaa, M.1
Scarbrough, C.2
Vijaykumar, T.N.3
Pomeranz, I.4
-
7
-
-
0142246882
-
-
W. Maly, A. Gattiker, T. Zanon, T. Vogels, R. D. Blanton, and T. Storey. Deformations of IC structure in test and yield learning. In International Test Conference (ITC), 2003.
-
W. Maly, A. Gattiker, T. Zanon, T. Vogels, R. D. Blanton, and T. Storey. Deformations of IC structure in test and yield learning. In International Test Conference (ITC), 2003.
-
-
-
-
13
-
-
0344896817
-
Effect of cmos technology scaling on thermal management during burn-in
-
O. Semenov, A. Vassighi, M. Sachdev, A. Keshavarzi, and C. F. Hawkins. Effect of cmos technology scaling on thermal management during burn-in. IEEE Transactions on Semiconductor Manufacturing, 16(4), 2003.
-
(2003)
IEEE Transactions on Semiconductor Manufacturing
, vol.16
, Issue.4
-
-
Semenov, O.1
Vassighi, A.2
Sachdev, M.3
Keshavarzi, A.4
Hawkins, C.F.5
-
15
-
-
0038684860
-
Temperature-aware microarchitecture
-
K. Skadron, M. R. Stan, W.Huang, S. Velusamy, K. Sankaranarayanan, and D. Tarjan. Temperature-aware microarchitecture. In Proceedings of the 30th Annual International Symposium on Computer Architecture, 2003.
-
(2003)
Proceedings of the 30th Annual International Symposium on Computer Architecture
-
-
Skadron, K.1
Stan, M.R.2
Huang, W.3
Velusamy, S.4
Sankaranarayanan, K.5
Tarjan, D.6
-
16
-
-
27544457181
-
Exploiting structural duplication for lifetime reliability enhancement
-
J. Srinivasan, S.V. Adve, P. Bose, and J, A. Rivers. Exploiting structural duplication for lifetime reliability enhancement. In ISCA '05: Proceedings of the 32nd Annual International Symposium on Computer Architecture, pages 520-531, 2005.
-
(2005)
ISCA '05: Proceedings of the 32nd Annual International Symposium on Computer Architecture
, pp. 520-531
-
-
Srinivasan, J.1
Adve, S.V.2
Bose, P.3
Rivers, J.A.4
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