The XMM-Large Scale Structure catalogue: X-ray sources and associated optical data. Version I

Monthly Notices of the Royal Astronomical Society

Volumn 382, Issue 1, 2007, Pages 279-290

  Pierre, M ^a   Chiappetti, L ^b   Pacaud, F ^a   Gueguen, A ^a   Libbrecht, C ^a   Altieri, B ^c   Aussel, H ^a   Gandhi, P ^d,n   Garcet, O ^e   Gosset, E ^e   Paioro, L ^b   Ponman, T J ^f   Read, A M ^g   Refregier, A ^a   Starck, J L ^a,h   Surdej, J ^e   Valtchanov, I ^c   Adami, C ⁱ   Alloin, D ^a   Alshino, A ^f   Andreon, S ^b   Birkinshaw, M ^j   Bremer, M ^j   Detal, A ^e   Duc, P A ^a   Galaz, G ^k   Jones, L ^f   Le Fevre J P ^h   Le Fevre O ⁱ   Maccagni, D ^b   Mazure, A ⁱ   Quintana, H ^k   Rottgering H J A ^l   Sprimont, P G ^e   Tasse, C ^l   Trinchieri, G ^b   Willis, J P ^m   more..

^a UNIVERSITÉ PARIS DIDEROT   (France)

^b INAF IASF MILANO   (Italy)

^c ESAESAC   (Spain)

^d UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^e UNIVERSITY OF LIÈGE   (Belgium)

^f UNIVERSITY OF BIRMINGHAM   (United Kingdom)

^g UNIVERSITY OF LEICESTER   (United Kingdom)

^h CEA SACLAY   (France)

ⁱ AIX MARSEILLE UNIVERSITÉ   (France)

^j UNIVERSITY OF BRISTOL   (United Kingdom)

^k PONTIFICIA UNIVERSIDAD CATÓLICA DE CHILE   (Chile)

^l LEIDEN UNIVERSITY   (Netherlands)

^m UNIVERSITY OF VICTORIA   (Canada)

ⁿ RIKEN   (Japan)

more..

Author keywords

Catalogues; Surveys; X rays: general

Indexed keywords

ELECTRON SOURCES; X RAY APPARATUS;

CATALOG; COUNT RATES; EXTENDED SOURCES; LARGE-SCALE STRUCTURE; OPTICAL DATA; OPTICAL-; SOURCE DETECTION; STRUCTURE SURVEY; X-RAY GENERAL; X-RAY SOURCES;

SURVEYS;

EID: 36049032378     PISSN: 00358711     EISSN: 13652966     Source Type: Journal    
DOI: 10.1111/j.1365-2966.2007.12354.x     Document Type: Article

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