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Volumn 353-358, Issue PART 2, 2007, Pages 1298-1301

Damage monitoring of thick CFRP beam using electrical impedance changes

Author keywords

Composites; Delamination; Electric impedance; Monitor; Monitoring; Response surface

Indexed keywords

DAMAGE DETECTION; DELAMINATION; ELECTRIC CURRENTS; ELECTRIC IMPEDANCE;

EID: 36049029069     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: 10.4028/0-87849-456-1.1298     Document Type: Conference Paper
Times cited : (9)

References (12)
  • 2
    • 36049029800 scopus 로고    scopus 로고
    • N. Muto, H. Yanagida, M. Miyayama, T. Nakatsuji, M. Sugita, Y. Ohtsuka.: J. of the Ja-pan Soc for Comp Mat 18-4, (1992), pp. 144 (in Japanese)
    • N. Muto, H. Yanagida, M. Miyayama, T. Nakatsuji, M. Sugita, Y. Ohtsuka.: J. of the Ja-pan Soc for Comp Mat 18-4, (1992), pp. 144 (in Japanese)
  • 5
    • 0032789363 scopus 로고    scopus 로고
    • J.C. Abry, S.Bochard, A. Chateauminois, M.Salvia,and:Comp Sci Tech,59, (1999),pp. 925
    • J.C. Abry, S.Bochard, A. Chateauminois, M.Salvia,and:Comp Sci Tech,59, (1999),pp. 925


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.