Detection and prediction of errors in EPCs of the SAP reference model

Data and Knowledge Engineering

Volumn 64, Issue 1, 2008, Pages 312-329

  Mendling, J ^a,b   Verbeek, H M W ^c   van Dongen, B F ^c   van der Aalst, W M P ^c   Neumann, G ^a  

^a VIENNA UNIVERSITY OF ECONOMICS AND BUSINESS   (Austria)

^b QUEENSLAND UNIVERSITY OF TECHNOLOGY   (Australia)

^c EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Business process management; Error prediction; Event driven process chains; Logistic regression; Verification; YAWL

Indexed keywords

COMPUTATIONAL COMPLEXITY; ERROR ANALYSIS; PROBABILITY DISTRIBUTIONS; REGRESSION ANALYSIS;

BUSINESS PROCESS MANAGEMENT; EVENT-DRIVEN PROCESS CHAINS; LOGISTIC REGRESSION;

DATA STRUCTURES;

EID: 36049019276     PISSN: 0169023X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.datak.2007.06.019     Document Type: Article

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