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1
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0031102349
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New photothermal deflection method for thermal diffusivity measurement of semiconductor wafers
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Bertolotti, M.1
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Li Voti, R.4
Paoloni, S.5
Sibilia, C.6
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2
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0000388347
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On the photodeflection method applied to low thermal diffusivity measurements
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0028532318
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A new method for the study of mirror heating of a semiconductor laser diode and for the determination of thermal diffusivity of the entire structure
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4
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0000989313
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Analysis of the photothermal deflection technique in the surface reflection scheme: Theory and experiment
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Bertolotti M., Liakhou G.L., Li Voti R., Paoloni S. and Sibilia C. (1998). Analysis of the photothermal deflection technique in the surface reflection scheme: theory and experiment. J. Appl. Phys. 83: 966-982
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5
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0041719325
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Thermophysical characterization of artificially aged papers by means of the photothermal deflection technique
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Bertolotti M., Ligia S., Liakhou G., Li Voti R., Paoloni S., Sibilia C., Ricciardiello G. and Alessi P. (1999). Thermophysical characterization of artificially aged papers by means of the photothermal deflection technique. J. Appl. Phys. 85: 2881-2887
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Thermo-optical spectroscopy: Detection by the "mirage effect"
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Phase transition-governed opal-VO2 photonic crystal
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Structural and photonic propreters of opal-GaN nanocomposites
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Visible light spectroscopy by photothermal radiometry using an incoherent source
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Photoacoustic effect with solids: A theoretical treatment
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Photothermal probing of inhomogeneously modulated transparent thin films
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Wright O.B., Li Voti R., Matsuda O., Larciprete M.C., Sibilia C. and Bertolotti M. (2002). Photothermal probing of inhomogeneously modulated transparent thin films. J. Appl. Phys. 91: 5002-5009
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Wright, O.B.1
Li Voti, R.2
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Larciprete, M.C.4
Sibilia, C.5
Bertolotti, M.6
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