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Volumn 582, Issue 3, 2007, Pages 701-704

Status and performance of the new innermost layer of silicon detector at DØ

Author keywords

D0; Layer 0; Silicon microstrip detector

Indexed keywords

MICROSTRIP DEVICES; RADIATION EFFECTS; READOUT SYSTEMS; SENSORS;

EID: 36049003064     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2007.07.055     Document Type: Article
Times cited : (5)

References (9)
  • 2
    • 36048990491 scopus 로고    scopus 로고
    • M. Johnson (DØ collaboration), Proceedings for the Sixth International "Hiroshima" Symposium on the Development and Application of Semiconductor Tracking Detectors, Santa Cruz, CA 2006. To be published in Nucl. Instr. and Meth.
  • 4
    • 36048982013 scopus 로고    scopus 로고
    • S. Burdin (DØ collaboration), FERMILAB-CONF-05-515-E, 2005.
  • 5
    • 36049012256 scopus 로고    scopus 로고
    • M. Stanitzki (CDF collaboration), Radiation hardness experience with the CDF/DØ Silicon vertex detectors, these proceedings.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.