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Volumn , Issue , 2007, Pages 585-594

How do mobile phones fail? A failure data analysis of symbian OS smart phones

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE DATA ANALYSIS; FAILURE SENSITIVITY; MALICIOUS ATTACKS; SMART PHONES;

EID: 36049002858     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DSN.2007.54     Document Type: Conference Paper
Times cited : (34)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.