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Volumn 78, Issue 10, 2007, Pages
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Demonstration of magnetoelectric scanning probe microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
AC FIELD SENSITIVITY;
FREQUENCY RANGE;
MAGNETOELECTRIC SENSOR;
POLYVINYLIDENE FLUORIDE;
MAGNETOELECTRIC EFFECTS;
MAGNETOSTRICTIVE DEVICES;
MICROSCOPES;
PIEZOELECTRICITY;
SCANNING PROBE MICROSCOPY;
SENSORS;
ARTICLE;
ELECTROMAGNETIC FIELD;
EQUIPMENT;
EQUIPMENT DESIGN;
INSTRUMENTATION;
METHODOLOGY;
PILOT STUDY;
REPRODUCIBILITY;
SCANNING PROBE MICROSCOPY;
SENSITIVITY AND SPECIFICITY;
ELECTROMAGNETICS;
EQUIPMENT DESIGN;
EQUIPMENT FAILURE ANALYSIS;
MICROSCOPY, SCANNING PROBE;
PILOT PROJECTS;
REPRODUCIBILITY OF RESULTS;
SENSITIVITY AND SPECIFICITY;
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EID: 36049000253
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2777197 Document Type: Article |
Times cited : (9)
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References (14)
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