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Volumn 108-109, Issue , 2005, Pages 401-406
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Silicon doped with sulfur as a detector material for high speed infrared image converters
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Author keywords
Doping silicon with sulfur; IR imaging; Silicon detectors
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Indexed keywords
DEFECTS;
IMAGE CONVERTERS;
INFRARED IMAGING;
LIQUEFIED GASES;
SEMICONDUCTOR DEVICE MANUFACTURE;
SEMICONDUCTOR DEVICES;
SEMICONDUCTOR DOPING;
SULFUR;
DEEP IMPURITIES;
DETECTOR MATERIALS;
GAS DISCHARGE;
HALL MEASUREMENTS;
HIGH-TEMPERATURE DIFFUSION;
RADIATION DOPING;
SHALLOW DONORS;
TEMPORAL RESOLUTION;
SILICON DETECTORS;
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EID: 36048994628
PISSN: 10120394
EISSN: 16629779
Source Type: Book Series
DOI: 10.4028/www.scientific.net/SSP.108-109.401 Document Type: Conference Paper |
Times cited : (4)
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References (13)
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