An ultrahigh vacuum fast-scanning and variable temperature scanning tunneling microscope for large scale imaging

Review of Scientific Instruments

Volumn 78, Issue 10, 2007, Pages

  Diaconescu, Bogdan ^a   Nenchev, Georgi ^a   De La Figuera, Juan ^b,c   Pohl, Karsten ^a  

^a UNIVERSITY OF NEW HAMPSHIRE   (United States)

^b UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^c INSTITUTO DE QUÍMICA FÍSICA ROCASOLANO   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL RESOLVING POWER; SCANNING TUNNELING MICROSCOPY; THERMAL EFFECTS; ULTRAHIGH VACUUM; VIBRATION ANALYSIS;

LARGE SCALE IMAGING; METALLIC SURFACES; ULTRAHIGH VACUUM FAST-SCANNING; VIBRATION ISOLATION;

IMAGING TECHNIQUES;

ARTICLE; COMPUTER ASSISTED DIAGNOSIS; EQUIPMENT; EQUIPMENT DESIGN; IMAGE ENHANCEMENT; INSTRUMENTATION; LABORATORY DIAGNOSIS; METHODOLOGY; REPRODUCIBILITY; SCANNING TUNNELING MICROSCOPY; SENSITIVITY AND SPECIFICITY; TEMPERATURE; VACUUM;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; MICROSCOPY, SCANNING TUNNELING; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SPECIMEN HANDLING; TEMPERATURE; VACUUM;

EID: 36048985426     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2789655     Document Type: Article

References (18)

1. G. Binnig and H. Rohrer, Rev. Mod. Phys. 59, 615 (1987).
2. M. Bott, T. Micheley, and G. Comsa, Rev. Sci. Instrum. 66, 4135 (1995).
3. M. A. Dubson and J. S. Hwang, Rev. Sci. Instrum. 63, 3643 (1992).
4. Insaco Incorporated (http://www.insaco.com).
5. DuPont (http://www.dupont.com).
6. A second STM head with a body build out of tantalum was tested showing the same drift characteristics as the Invar one.
7. Staveley NDT Technologies (http://www.staveleyndt.com).
8. S. H. Pan, E. W. Hudson, and J. C. Davis, Rev. Sci. Instrum. 70, 1459 (1999).
9. Epoxy Technology (http://www.epotek.com).
10. A. K. Schmid (private communication).
11. G. E. Thayer, Ph.D. thesis, University of California at Davis, 2001.
12. J. P. Ibe, P. P. Bey, Jr., S. L. Brandow, R. A. Brizzolara, N. A. Burnham, D. P. DiLella, K. P. Lee, C. R. K. Marrian, and R. J. Colton, J. Vac. Sci. Technol. B 8, 3570 (1990).
13. B. Diaconescu, G. Nenchev, J. Jones, and K. Pohl, Microsc. Res. Tech. 70, 547 (2007).
14. We used two SPM electronic configurations: (i) Scala II from Omicron NanoTechnology (http://www.om.icran.de) and (ii) STM-100 Rev. 4 from RHK Technology (http://www.rhk-tech.com) with GXSM as control software [P. Zahl, M. Bierkandt, S. Schröder, and A. Klust, Rev. Sci. Instrum. 74, 1222 (2003)] and Omicron microslide control unit for the coarse approach motors.
15. C. Günther, J. Vrijmoeth, R. Q. Hwang, and R. J. Behm, Phys. Rev. Lett. 74, 754 (1995).
16. J. V. Barth, H. Brune, G. Ertl, and R. J. Behm, Phys. Rev. B 42, 9307 (1990).
17. R. Q. Hwang, J. C. Hamilton, J. L. Stevens, and S. M. Foiles, Phys. Rev. Lett. 75, 4242 (1995).
18. W. L. Ling, J. de la Figuera, N. C. Bartelt, R. Q. Hwang, A. K. Schmid, G. E. Thayer, and J. C. Hamilton, Phys. Rev. Lett. 92, 116102 (2004).