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Volumn 582, Issue 3, 2007, Pages 854-857
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Planar edgeless silicon detectors for the TOTEM experiment
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Author keywords
Edgeless; Leakage current; Silicon detectors; Terminating structure
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Indexed keywords
ELECTRIC BREAKDOWN;
ELECTRIC FIELDS;
ELECTRONIC STRUCTURE;
LEAKAGE CURRENTS;
SENSITIVITY ANALYSIS;
EDGELESS;
STANDARD PLANAR TECHNOLOGY;
TERMINATING STRUCTURE;
SILICON DETECTORS;
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EID: 36048965234
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2007.07.110 Document Type: Article |
Times cited : (10)
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References (8)
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