A Raman, infrared and XRD analysis of the instability in volcanic opals from Mexico

Spectrochimica Acta - Part A: Molecular and Biomolecular Spectroscopy

Volumn 68, Issue 4, 2007, Pages 1070-1076

  Ostrooumov, Mikhail ^a  

^a UNIVERSIDAD MICHOACANA DE SAN NICOLÁS DE HIDALGO   (Mexico)

Author keywords

Destabilization phenomena; Opal; Raman and infrared spectroscopy; XRD analysis

Indexed keywords

CRYSTALLIZATION; POLYMORPHISM; RAMAN SPECTROSCOPY; SILICON COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

DESTABILIZATION PHENOMENA; MOLECULAR WATER; ROOM TEMPERATURES; VOLCANIC OPALS;

INFRARED SPECTROSCOPY;

SILICON DIOXIDE;

ARTICLE; CHEMISTRY; COMPARATIVE STUDY; INFRARED SPECTROPHOTOMETRY; MEXICO; RAMAN SPECTROMETRY; VOLCANO; X RAY DIFFRACTION;

MEXICO; SILICON DIOXIDE; SPECTROPHOTOMETRY, INFRARED; SPECTRUM ANALYSIS, RAMAN; VOLCANIC ERUPTION; X-RAY DIFFRACTION;

EID: 36048957271     PISSN: 13861425     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.saa.2007.06.048     Document Type: Article

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