Performance trade-offs in single-photon avalanche diode miniaturization

Review of Scientific Instruments

Volumn 78, Issue 10, 2007, Pages

  Finkelstein, Hod ^a   Hsu, Mark J ^a   Zlatanovic, Sanja ^a   Esener, Sadik ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE; IMAGE SENSORS; PHOTONS; SEMICONDUCTOR MATERIALS; SIGNAL TO NOISE RATIO; THREE DIMENSIONAL;

ACTIVE-RECHARGE CIRCUITS; DEAD TIME; MINIATURIZATION; SEMICONDUCTOR TECHNOLOGY;

AVALANCHE DIODES;

ARTICLE; ELECTRONICS; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; PHOTON; SEMICONDUCTOR; SIGNAL PROCESSING;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MINIATURIZATION; PHOTONS; SEMICONDUCTORS; SIGNAL PROCESSING, COMPUTER-ASSISTED;

EID: 36048947065     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2796146     Document Type: Article

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